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The K150X Thickness Monitor for Thin Film Measurement

The K150 consists of a Control Unit external to the Instrument and a Crystal Holder with an Interconnection Lead and K150 Thin Film Thickness MonitorPre-Amplifier. In addition, it has a vacuum collar to suit the appropriate Instrument Chamber.

The Quartz Crystal is placed in the Vacuum work chamber. One face of the Crystal is exposed towards the deposition source, such that, as material is deposited it will coat the Crystal.

The Crystal is connected via a vacuum feed through to external components, the whole becoming an oscillator whose output is controlled by the frequency of Crystal oscillation. As material is deposited on the Crystal, so its frequency of oscillation is modified.

This 'modification' is used to determine the thickness of material deposited.


Features:

  • Terminate Facility
  • Pre-selectable Material Density
  • Programmable ‘Tooling Factor’
  • Microprocessor Controlled
  • Clean Line Design
  • Automatic or Manual Mode
  • Back Lit L.C.D. Display
  • Pre Set Programme Memory Storage

Specification:

Instrument Case - 300mm W x 140mm D x 40mm H
Weight - 2Kg
Crystal Holder - Exchange Crystal Facility.
Density Range - To 23.0g/cm3
Measurement Range - To 999nm.
Resolution - 0.1nm.

Electrical Supply - 230 Volts 50Hz (1 amp Max.)
115 Volts 60Hz (2 amp max. )